DESIGN OF VLSI ASYNCHRONOUS CIRCUITS FOR TESTABILITY

被引：0
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作者：
LI, T
机构：
来源：
INTERNATIONAL JOURNAL OF ELECTRONICS | 1988年 / 64卷 / 06期
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D O I：
10.1080/00207218808962860
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：859 / 868
页数：10
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