Deterministic BIST with multiple scan chains

被引：0
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作者：
Kiefer, Gundolf [1 ]
Wunderlich, Hans-Joachim [1 ]
机构：
[1] Computer Architecture Lab., Institute of Computer Science, University of Stuttgart, Breitwiesenstr 20/22, 70565 Stuttgart, Germany
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1999年 / 14卷 / 01期
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页码：85 / 93
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