INTRINSIC STRESS OF PHOSPHORUS- AND BORON-DOPED AMORPHOUS SILICON FILMS.

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作者
Kakinuma, Hiroaki [1 ]
机构
[1] Oki Electric Industry Co, Hachioji, Jpn, Oki Electric Industry Co, Hachioji, Jpn
关键词
HYDROGEN - Bonding - SEMICONDUCTING FILMS - Doping - STRESSES;
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摘要
The relationship between the intrinsic stress and hydrogen-bonding configuration for plasma-produced hydrogenated amorphous silicon (a-Si:H) films doped with phosphorus and boron has been studied in the gas-phase doping ratios from 0 to 5 multiplied by 10** minus **3 prepared with different substrate temperatures. We found the same strong correlation between the sign and strength of intrinsic stress sigma //i and the infrared stretching-mode absorption ratio I(SiH//2)/I(SiH) ( equals R) as in a previous study on undoped films.
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页码:671 / 676
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