Angular measurements with X-ray interferometry

被引：0

作者：

Windisch, D. ^{[1
]}

Becker, P. ^{[1
]}

机构：

[1] Physikalisch-Technische, Bundesanstalt, Braunschweig, Germany

来源：

Journal of Applied Crystallography | 1992年 / 25卷 / pt 3期

关键词：

Interferometers;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：377 / 383

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