X-ray Phase Measurements with Talbot Interferometry and Its Applications

被引：2
|
作者：
Momose, Atsushi [1 ]
Yashiro, Wataru [1 ]
机构：
[1] Univ Tokyo, Grad Sch Frontier Sci, Dept Adv Mat Sci, Chiba 2778561, Japan
来源：
INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AN IMAGING | 2010年 / 1236卷
关键词：
X-ray; synchrotron radiation; phase tomography; Talbot effect; grating; phase contrast; medical imaging; TOMOGRAPHY;
D O I：
10.1063/1.3426109
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We report three applications of X-ray grating interferometry, which employs X-ray transmission gratings, to Xray phase imaging and phase tomography for weakly absorbing objects. The fusion with a normal X-ray imaging microscope enabled phase-sensitive microscopic observation. The operation with a white synchrotron light enabled highspeed X-ray imaging and furthermore four-dimensional phase tomography. Finally, the development of a practical phase imaging technique using a conventional X-ray generator is reported for future clinical applications.
引用
收藏
页码：195 / 199
页数：5
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