Nanometrology by x-ray interferometry

被引：1

作者：

Chetwynd, DG ^{[1
]}

机构：

[1] Univ Warwick, Dept Engn, Ctr Nanotechnol & Microengn, Coventry CV4 7AL, W Midlands, England

来源：

MEASUREMENT & CONTROL | 1998年 / 31卷 / 02期

关键词：

D O I：

10.1177/002029409803100203

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

[No abstract available]

引用

页码：43 / 47

页数：5

共 50 条

[1] Hyperspectral X-Ray Imaging For Nanometrology
Safonov, A.I.
Nikolaev, K.V.
Yakunin, S.N.
[J]. Crystallography Reports, 2024, 69 (04) : 609 - 619
[2] X-ray interferometry
Cash, W
[J]. GALAXIES AND THEIR CONSTITUENTS AT THE HIGHEST ANGULAR RESOLUTIONS, 2001, (205): : 457 - 462
[3] X-Ray Interferometry
Webster Cash
[J]. Experimental Astronomy, 2003, 16 : 91 - 136
[4] X-ray interferometry
Cash, W
[J]. FUTURE DIRECTIONS IN HIGH RESOLUTION ASTRONOMY: THE 10TH ANNIVERSARY OF THE VLBA, 2005, 340 : 633 - 638
[5] X-ray interferometry
Cash, W
[J]. EXPERIMENTAL ASTRONOMY, 2003, 16 (02) : 91 - 136
[6] X-RAY AND NEUTRON INTERFEROMETRY
TREIMER, W
[J]. KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1978, 13 (09): : 1105 - 1116
[7] PRINCIPLE OF X-RAY INTERFEROMETRY
KURIYAMA, M
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAY1) : 273 - &
[8] A DIFFRACTOMETER FOR X-RAY INTERFEROMETRY
SPIEKER, P
ANDO, M
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3): : 609 - 611
[9] INTRACRYSTAL X-RAY INTERFEROMETRY
ANDREEV, AV
[J]. SOLID STATE COMMUNICATIONS, 1988, 66 (08) : 831 - 833
[10] Applications of X-ray interferometry
Bowen, DK
[J]. X-RAY AND NEUTRON DYNAMICAL DIFFRACTION: THEORY AND APPLICATIONS, 1996, 357 : 381 - 410