Angular measurements with X-ray interferometry

被引：0
|
作者：
Windisch, D. [1 ]
Becker, P. [1 ]
机构：
[1] Physikalisch-Technische, Bundesanstalt, Braunschweig, Germany
来源：
Journal of Applied Crystallography | 1992年 / 25卷 / pt 3期
关键词：
Interferometers;
D O I：
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学科分类号：
摘要：
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页码：377 / 383
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