Lateral current spreading in SiC Schottky diodes using field-plate edge termination

被引：0
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作者：
Zhang, Q. [1 ]
Madangarli, V. [1 ]
Tarplee, M. [1 ]
Sudarshan, T.S. [1 ]
机构：
[1] Department of Electrical Engineering, University of South Carolina, Columbia, SC 29208, United States
来源：
Materials Science Forum | 2000年 / 338卷
关键词：
Current spreading;
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