Design-for-test methodologies and tools for ASIC design

被引:0
|
作者
Strickland, Terry [1 ]
机构
[1] Compass Design Automation, San Jose, United States
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] DESIGN-FOR-TEST METHODOLOGIES AND TOOLS FOR ASIC DESIGN
    STRICKLAND, T
    ELECTRONIC PRODUCTS MAGAZINE, 1995, 38 (01): : 25 - &
  • [2] ASIC DESIGN - HIGH-DENSITY ICS NEED DESIGN-FOR-TEST METHODS
    MARKOWITZ, MC
    EDN, 1988, 33 (24) : 73 - &
  • [3] Scanning test synthesis tools for asic design
    Aitken, Rob, 1600, Findlay Publ Ltd, Horton Kirby, United Kingdom (27):
  • [4] Design-for-test techniques
    Lovelace, ME
    AUTOTESTCON '97 - IEEE SYSTEMS READINESS TECHNOLOGY CONFERENCE, 1997 IEEE AUTOTESTCON PROCEEDINGS, 1997, : 390 - 393
  • [5] Design-for-Test Methodologies for Current Tests in Analog/Mixed-Signal Power SOCs
    Kulovic, Kemal
    Maltabas, Samed
    Margala, Martin
    2012 IEEE 55TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), 2012, : 1056 - 1059
  • [6] IC design-for-test and testability features
    Press, Ron
    2008 IEEE AUTOTESTCON, VOLS 1 AND 2, 2008, : 407 - 410
  • [7] LASER PRINTER DESIGN STRATEGY EMPHASIZES DESIGN-FOR-TEST
    CHILD, J
    COMPUTER DESIGN, 1992, 31 (01): : 91 - 93
  • [8] CAD TOOLS FOR ASIC DESIGN
    NEWTON, AR
    SANGIOVANNIVINCENTELLI, AL
    PROCEEDINGS OF THE IEEE, 1987, 75 (06) : 765 - 776
  • [9] ASICs & ASIC design tools
    Computer Design, 1992, 31 (11):
  • [10] Incorporating physical design-for-test into routing
    McGowen, R
    Ferguson, FJ
    ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY, 1997, : 685 - 693