Constrained state assignment of easily testable FSMs

被引：0
|
作者：
Avedillo, Maria J. [1 ]
Quintana, Jose M. [1 ]
Huertas, Jose L. [1 ]
机构：
[1] Centro Nacional de Microelectronica, Sevilla, Spain
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1995年 / 6卷 / 01期
关键词：
714.2 Semiconductor Devices and Integrated Circuits - 721.1 Computer Theory; Includes Computational Logic; Automata Theory; Switching Theory; Programming Theory - 721.2 Logic Elements - 723.1 Computer Programming - 723.2 Data Processing and Image Processing - 921.5 Optimization Techniques;
D O I：
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中图分类号：
学科分类号：
摘要：
8
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页码：133 / 138
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