Method for fulfilling high rate of fault diagnosed in analog circuit

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作者：
School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China [1 ]
不详 [2 ]
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来源：
Jisuanji Fuzhu Sheji Yu Tuxingxue Xuebao | 2008年 / 10卷 / 1303-1306期
关键词：
Multiresolution analysis;
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