New method of analog circuit fault diagnosis

被引：0
|
作者：
Jin, Yu [1 ]
Chen, Guangju [1 ]
Liu, Hong [1 ]
机构：
[1] CAT Lab., School of Automation Engineering, UESTC, Chengdu 610054, China
来源：
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument | 2007年 / 28卷 / 10期
关键词：
11;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1870 / 1873
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