Method on analog circuit fault diagnosis with tolerance

被引：0
|
作者：
Li, Yan-Jun [1 ]
Wang, Hou-Jun [1 ]
Zhou, Long-Fu [1 ]
Shi, Yi-Bing [1 ]
机构：
[1] School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
来源：
Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China | 2010年 / 39卷 / 03期
关键词：
10;
D O I：
10.3969/j.issn.1001-0548.2010.03.013
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：384 / 387
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