A new method for fault feature extraction of analog circuit

被引：0
|
作者：
Hou Qingjian [1 ]
Wang Hongli [1 ]
机构：
[1] Hi Tech, Xian Res Inst, Xian 710025, Peoples R China
来源：
7TH INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION AND CONTROL TECHNOLOGY: MEASUREMENT THEORY AND SYSTEMS AND AERONAUTICAL EQUIPMENT | 2008年 / 7128卷
关键词：
analog circuit; fault feature; empirical mode decomposition; end effect; least square support vector machine;
D O I：
10.1117/12.806551
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
The feature extraction is one of key steps in fault diagnosis. A method of least square support vector machine (LSSVM) is put forward based on genetic optimization to restrain the end effect of empirical mode decomposition (EMD). Based on the method, a method of feature extraction is put forward. The energy of intrinsic mode functions (IMF) generated from EMD is to be the feature to distinguishing faults. The result of feature extraction experiment of analog circuit shows that the method is effective.
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页数：7
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