共 28 条
- [1] Embedded FeRAM Challenges in the 65-nm Technology Node and Beyond 2006 15TH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, 2007, : 78 - +
- [2] EPL performance in 65-nm node metallization technology and beyond Emerging Lithographic Technologies IX, Pts 1 and 2, 2005, 5751 : 501 - 508
- [3] Lithography solution for 65-nm node system LSIs 2002 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2002, : 196 - 197
- [4] Reticle CD-SEM for the 65-nm technology node and beyond 24TH ANNUAL BACUS SYMPOSIUM ON PHOTOMASK TECHNOLOGY, PT 1 AND 2, 2004, 5567 : 876 - 886
- [5] High performance reticle inspection tool for the 65-nm node and beyond - art. no. 660716 PHOTOMASK AND NEXT-GENERATION LITHOGRAPHY MASK TECHNOLOGY XIV, PTS 1 AND 2, 2007, 6607 : 60716 - 60716
- [6] High-performance CMOS variability in the 65-nm regime and beyond IBM Journal of Research and Development, 2006, 50 (4-5): : 433 - 449
- [8] Novel real-time etching depth testing system for micro-fabrication Guangxue Xuebao, 6 (745-749):
- [9] Microstructure Formation on Glass Substrates for High-productivity Fabrication of Micro-vias Using 248 nm Excimer Laser JOURNAL OF LASER MICRO NANOENGINEERING, 2023, 18 (02): : 83 - 86
- [10] Usage of overlay metrology simulator in design of overlay metrology tools for the 65-nm node and beyond METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XVIII, PTS 1 AND 2, 2004, 5375 : 254 - 265