共 50 条
- [1] Study of Fabrication and Reliability for the extremely large 2.5D advanced Package 2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC, 2023, : 899 - 906
- [2] Wafer Level Reliability Characterization of 2.5D IC packages 2018 IEEE 20TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2018, : 274 - 277
- [3] Unified Redistribution Layer Routing for 2.5D IC Packages 2020 25TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC 2020, 2020, : 331 - 337
- [4] TSV Technology for 2.5D IC Solution 2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2012, : 284 - 288
- [5] Methods to enable fault isolation on 2.5d molded interposer packages Electronic Device Failure Analysis, 2021, 23 (04): : 14 - 17
- [6] Modeling and Design for System-Level Reliability and Warpage Mitigation of Large 2.5D Glass BGA Packages IEEE 72ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2022), 2022, : 1060 - 1067
- [7] Material Technology for 2.5D/3D Package IEEE CPMT SYMPOSIUM JAPAN 2015, (ICSJ 2015), 2015, : 101 - 104
- [8] Transient Thermal Characterization of Junction to Case Thermal Resistance for 2.5D Packages 2018 19TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2018, : 115 - 120
- [9] Iterative Delayering and Electrical Fault Isolation for Defect Localization in 2.5D Packages 2019 IEEE 21ST ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2019, : 189 - 191
- [10] Any-Angle Routing for Redistribution Layers in 2.5D IC Packages 2023 60TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, DAC, 2023,