Growth of SiGe by D-UHV/CVD at low temperature

被引:0
|
作者
State Key Laboratory of Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China [1 ]
机构
来源
Pan Tao Ti Hsueh Pao | 2008年 / 10卷 / 1889-1892期
关键词
Si-Ge alloys;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:1889 / 1892
相关论文
共 50 条
  • [21] 弛豫SiGe外延层的UHV/CVD生长
    罗广礼
    林小峰
    刘志农
    陈培毅
    林惠旺
    钱佩信
    刘安生
    半导体学报, 2000, (07) : 682 - 685
  • [22] The effects of neutron irradiation on the cryogenic properties of UHV/CVD SiGe HBTs
    Roldan, JM
    Cressler, JD
    NguyenNgoc, D
    Clark, SD
    PROCEEDINGS OF THE FOURTH SYMPOSIUM ON LOW TEMPERATURE ELECTRONICS AND HIGH TEMPERATURE SUPERCONDUCTIVITY, 1997, 97 (02): : 246 - 253
  • [23] Absorption measurement of strained SiGe nanostructures deposited by UHV-CVD
    Palfinger, G
    Bitnar, B
    Sigg, H
    Müller, E
    Stutz, S
    Grützmacher, D
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2003, 16 (3-4): : 481 - 488
  • [24] A 2-D numerical simulation methodology for noise figure optimization in UHV/CVD SiGe HBT's
    Niu, GF
    Ansley, WE
    Zhang, SM
    Cressler, JD
    Groves, R
    1998 TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS: DIGEST OF PAPERS, 1998, : 33 - 37
  • [25] Structural characterization of a UHV/CVD-grown SiGe HBT with graded base
    Dion, M
    Houghton, DC
    Rowell, NL
    Perovic, DD
    Aers, GC
    Rolfe, SJ
    Sproule, GI
    Phillips, JR
    THIN SOLID FILMS, 1998, 321 : 167 - 171
  • [26] 用于SiGe材料生长的新型UHV/UV/CVD系统
    刘洪宁
    孙建诚
    胡辉勇
    张鹤鸣
    真空电子技术, 2000, (03) : 26 - 28
  • [27] Neutron radiation tolerance of advanced UHV/CVD SiGe HBT BiCMOS technology
    Roldan, Juan M.
    Ansley, William E.
    Cressler, John D.
    Clark, Steven D.
    Nguyen-Ngoc, Dominique
    IEEE Transactions on Nuclear Science, 1997, 44 (6 pt 1): : 1965 - 1973
  • [28] Neutron radiation tolerance of advanced UHV/CVD SiGe HBT BiCMOS technology
    Roldan, JM
    Ansley, WE
    Cressler, JD
    Clark, SD
    Nguyen-Ngoc, D
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 1965 - 1973
  • [29] Scaling issues and Ge profile optimization in advanced UHV/CVD SiGe HBTs
    Richey, DM
    Cressler, JD
    PROCEEDINGS OF THE 1996 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, 1996, : 19 - 22
  • [30] SINGLE-WAFER EPITAXY OF SI AND SIGE USING UHV-CVD
    GLOWACKI, F
    CAMPIDELLI, Y
    MICROELECTRONIC ENGINEERING, 1994, 25 (2-4) : 161 - 170