New approach to test generation for combinational circuits

被引：0
|
作者：
Zhao, Chun-Hui [1 ]
Hou, Yan-Li [1 ]
Hu, Jia-Wei [1 ]
Lan, Hai-Yan [1 ]
机构：
[1] School of Information and Communication Engineering, Harbin Engineering University, Harbin 150001, China
来源：
Journal of Harbin Institute of Technology (New Series) | 2009年 / 16卷 / 01期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Particle swarm optimization (PSO)
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页码：61 / 65
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