New approach to test generation for combinational circuits

被引：0

作者：

Zhao, Chun-Hui ^{[1
]}

Hou, Yan-Li ^{[1
]}

Hu, Jia-Wei ^{[1
]}

Lan, Hai-Yan ^{[1
]}

机构：

[1] School of Information and Communication Engineering, Harbin Engineering University, Harbin 150001, China

来源：

Journal of Harbin Institute of Technology (New Series) | 2009年 / 16卷 / 01期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Particle swarm optimization (PSO)

引用

页码：61 / 65

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