Pattern classification of fabric defects using a probabilistic neural network and its hardware implementation using the field programmable gate array system

被引:0
|
作者
Hasnat A. [1 ]
Ghosh A. [1 ]
Khatun A. [2 ]
Halder S. [3 ]
机构
[1] Government College of Engineering & Textile Technology, Berhampore, West Bengal
[2] Jadavpur University, Kolkata, West Bengal
[3] Government Govt. College of Engineering and Leather Technology, Kolkata, West Bengal
来源
| 1600年 / Lukasiewicz Research Network - Institute of Biopolymers and Chemical Fibres卷 / 25期
关键词
Classification; Fabric defect; Field programmable gate arrays; Probabilistic neural network; Radial basis function;
D O I
10.5604/01.3001.0010.1709
中图分类号
学科分类号
摘要
This study proposes a fabric defect classification system using a Probabilistic Neural Network (PNN) and its hardware implementation using a Field Programmable Gate Arrays (FPGA) based system. The PNN classifier achieves an accuracy of 98 ± 2% for the test data set, whereas the FPGA based hardware system of the PNN classifier realises about 94±2% testing accuracy. The FPGA system operates as fast as 50.777 MHz, corresponding to a clock period of 19.694 ns. © 2017, Institute of Biopolymers and Chemical Fibres. All rights reserved.
引用
收藏
页码:42 / 48
页数:6
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