Fringe pattern demodulation using the one-dimensional continuous wavelet transform: field-programmable gate array implementation

被引:7
|
作者
Abid, Abdulbasit [1 ]
机构
[1] Umm Al Qura Univ, Coll Comp & Informat Syst, Dept Comp Engn, Mecca, Saudi Arabia
关键词
D O I
10.1364/AO.52.001468
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper presents a thorough discussion of the proposed field-programmable gate array (FPGA) implementation for fringe pattern demodulation using the one-dimensional continuous wavelet transform (1D-CWT) algorithm. This algorithm is also known as wavelet transform profilometry. Initially, the 1D-CWT is programmed using the C programming language and compiled into VHDL using the ImpulseC tool. This VHDL code is implemented on the Altera Cyclone IV GX EP4CGX150DF31C7 FPGA. A fringe pattern image with a size of 512 x 512 pixels is presented to the FPGA, which processes the image using the 1D-CWT algorithm. The FPGA requires approximately 100 ms to process the image and produce a wrapped phase map. For performance comparison purposes, the 1D-CWT algorithm is programmed using the C language. The C code is then compiled using the Intel compiler version 13.0. The compiled code is run on a Dell Precision state-of-the-art workstation. The time required to process the fringe pattern image is approximately 1 s. In order to further reduce the execution time, the 1D-CWT is reprogramed using Intel Integrated Primitive Performance (IPP) Library Version 7.1. The execution time was reduced to approximately 650 ms. This confirms that at least sixfold speedup was gained using FPGA implementation over a state-of-the-art workstation that executes heavily optimized implementation of the 1D-CWT algorithm. (C) 2013 Optical Society of America
引用
收藏
页码:1468 / 1471
页数:4
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