Friction measurements of CNx and TiCxNy films by scanning force microscopy

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[1] Morant, C.
[2] Fernández, L.A.
[3] Quirós, C.
[4] Fuentes, G.G.
[5] Elizalde, E.
[6] Sanz, J.M.
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Morant, C. | 2000年 / John Wiley & Sons Ltd, Chichester, United Kingdom卷 / 30期
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10.1002/1096-9918(200008)30:13.0.CO;2-S
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