Friction measurements of CNx and TiCxNy films by scanning force microscopy

被引：0
|
作者：
机构：
[1] Morant, C.
[2] Fernández, L.A.
[3] Quirós, C.
[4] Fuentes, G.G.
[5] Elizalde, E.
[6] Sanz, J.M.
来源：
Morant, C. | 2000年 / John Wiley & Sons Ltd, Chichester, United Kingdom卷 / 30期
关键词：
D O I：
10.1002/1096-9918(200008)30:13.0.CO;2-S
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Energy dissipation in scanning force microscopy-friction on an atomic scale
    Colchero, J.
    Baro, A. M.
    Marti, O.
    TRIBOLOGY LETTERS, 1996, 2 (04) : 327 - 343
  • [32] Mechanical and friction properties of thermoplastic polyurethanes determined by scanning force microscopy
    Mailhot, B
    Komvopoulos, K
    Ward, B
    Tian, Y
    Somorjai, GA
    JOURNAL OF APPLIED PHYSICS, 2001, 89 (10) : 5712 - 5719
  • [33] Microscale friction investigation of polysilicon surface using scanning force microscopy
    Flueraru, C
    Cobianu, C
    Dascalu, D
    Flueraru, M
    EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 1998, 3 (01): : 29 - 33
  • [34] Compositional mapping of metal films by friction force microscopy and force modulation methods
    Yamamoto, S
    Yamada, H
    Matsushige, K
    FUNDAMENTALS OF NANOINDENTATION AND NANOTRIBOLOGY, 1998, 522 : 475 - 480
  • [35] Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy
    Bhushan, B
    Sundararajan, S
    ACTA MATERIALIA, 1998, 46 (11) : 3793 - 3804
  • [36] Study of mixed Langmuir-Blodgett films of hydrocarbon and fluorocarbon amphiphilic compounds by scanning surface potential microscopy and friction force microscopy
    Yagi, K
    Fujihira, M
    APPLIED SURFACE SCIENCE, 2000, 157 (04) : 405 - 411
  • [37] FRICTION FORCE MICROSCOPY OF MIXED LANGMUIR-BLODGETT-FILMS
    MEYER, E
    OVERNEY, R
    LUTHI, R
    BRODBECK, D
    HOWALD, L
    FROMMER, J
    GUNTHERODT, HJ
    WOLTER, O
    FUJIHIRA, M
    TAKANO, H
    GOTOH, Y
    THIN SOLID FILMS, 1992, 220 (1-2) : 132 - 137
  • [38] Distance-dependent noise measurements in scanning force microscopy
    Roters, A
    Johannsmann, D
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1996, 8 (41) : 7561 - 7577
  • [39] SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CARBON-DIAMOND FILMS
    WELLAND, ME
    MCKINNON, AW
    OSHEA, S
    AMARATUNGA, GAJ
    DIAMOND AND RELATED MATERIALS, 1992, 1 (5-6) : 529 - 534
  • [40] SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF THIN POLYMER-FILMS
    MIZES, HA
    LOH, KG
    MILLER, RJD
    CONWELL, EM
    ARBUCKLE, GA
    THEOPHILOU, N
    MACDIARMID, AG
    HSIEH, BR
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1991, 194 : 305 - 310
12345