Device level 3D integration technologies for high performance/reliability modules

被引:0
|
作者
Houston, Paul [1 ]
Lewis, Brian [1 ]
Pathammavong, Keck [1 ]
Sparks, Tim [1 ]
Baldwin, Daniel F. [1 ]
机构
[1] ENGENT, Inc., Enabling Next Generation Technologies, 3140 Northwoods Parkway, Norcross, GA 30071, United States
来源
Advancing Microelectronics | 2010年 / 37卷 / 06期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:12 / 18
相关论文
共 50 条
  • [31] High Density 3D Integration
    Yu, Roy
    2008 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING, VOLS 1 AND 2, 2008, : 13 - 22
  • [32] A Novel Si-based X'tal Oscillator Device Using 3D Integration Technologies
    Shih, Jian-Yu
    Chen, Yen-Chi
    Chiu, Chih-Hung
    Lo, Chung-Lun
    Chen, Kuan-Neng
    PROCEEDINGS OF TECHNICAL PROGRAM - 2014 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA), 2014,
  • [33] 2.5D/3D Integration Technologies for Circuit Obfuscation
    Xie, Yang
    Bao, Chongxi
    Liu, Yuntao
    Srivastava, Ankur
    2016 17TH INTERNATIONAL WORKSHOP ON MICROPROCESSOR AND SOC TEST AND VERIFICATION (MTV), 2016, : 39 - 44
  • [34] Development of High Frequency Device using Glass or Fused Silica with 3D Integration
    Takahashi, Shintaro
    Sato, Yoichiro
    Horiuchi, Kohei
    Ono, Motoshi
    2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017), 2017, : 758 - 763
  • [35] Reliability Challenges for 2.5D/3D Integration: an Overview
    Premachandran, C. S.
    Choi, Seungman
    Cimino, Salvatore
    Thuy Tran-Quinn
    Burrell, Lloyd
    Justison, Patrick
    2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2018,
  • [36] Reliability Challenges in 2.5D and 3D IC Integration
    Li, Li
    Ton, Paul
    Nagar, Mohan
    Chia, Pierre
    2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017), 2017, : 1504 - 1509
  • [37] Failure Diagnostics for 3D System Integration Technologies in Microelectronics
    Altmann, F.
    Schmidt, C.
    Brand, S.
    Czurratis, P.
    Petzold, M.
    SEMICONDUCTOR WAFER BONDING 11: SCIENCE, TECHNOLOGY, AND APPLICATIONS - IN HONOR OF ULRICH GOSELE, 2010, 33 (04): : 47 - 57
  • [38] Integration of Assistive Technologies into 3D Simulations: An Exploratory Study
    Chan, Angela T.
    Gamino, Alexander
    Harris, Frederick C., Jr.
    Dascalu, Sergiu
    INFORMATION TECHNOLOGY: NEW GENERATIONS, 2016, 448 : 425 - 437
  • [39] 3D Integration Technologies for Ceramic Substrates in a SHM Application
    Hildebrandt, Samuel
    Wolter, Klaus-Juergen
    2009 EUROPEAN MICROELECTRONICS AND PACKAGING CONFERENCE (EMPC 2009), VOLS 1 AND 2, 2009, : 692 - 696
  • [40] Enabling System Design in 3D Integration: Technologies and Methodologies
    Chen, Hung-Ming
    PROCEEDINGS OF THE 2024 INTERNATIONAL SYMPOSIUM ON PHYSICAL DESIGN, ISPD 2024, 2024, : 217 - 217