Frequency domain pre-processing for automatic defect inspection of TFT-LCD panels

被引：0
|
作者：
Nam, Hyun-Do
Nam, Seung-Uk
机构：
来源：
Transactions of the Korean Institute of Electrical Engineers | 2008年 / 57卷 / 07期
关键词：
Inverse transforms - Notch filters - Thin film transistors - Frequency domain analysis - Inverse problems - Liquid crystal displays - Bandpass filters - Defects - Fast Fourier transforms;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Large-sized flat-panel displays are widely used for PC monitors and TV displays. In this paper, frequency domain pre-filter algorithms are presented for detection of defects in large-sized Thin Film Transistor-Liquid Crystal Display(TFT-LCD) panel surfaces. Frequency analysis with 1-D, 2-D FFT methods for extract the periodic patterns of lattice structures in TFT-LCD is performed. To remove this patterns, frequency domain band-stop filters were used for eliminating specific frequency components. In order to acquire only defected images, 2-D inverse FFT methods to inverse transform of frequency domain images were used.
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页码：1295 / 1297
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