Morphological blob-Mura defect detection method for TFT-LCD panel inspection

The current paper proposes a blob-Mura defect detection method for TFT-LCD panel inspection. A new constraint function that can grow and shrink is defined. Specially, a morphology-based preprocessing method is proposed to improve the detecting capacity of a blob-Mura-defect-detecting algorithm, whereby a test image with blob-Mura defects is expanded to facilitate the defect detection. Plus, in the case of defects with a diameter over 49 pixels, which are hard to detect due to the non-uniformity of their interior, the proposed method changes the image size instead of the constraint function size. The proposed method enables superior defect detection and the use of a simple detecting algorithm.