Frequency domain pre-processing for automatic defect inspection of TFT-LCD panels

被引：0
|
作者：
Nam, Hyun-Do
Nam, Seung-Uk
机构：
来源：
Transactions of the Korean Institute of Electrical Engineers | 2008年 / 57卷 / 07期
关键词：
Inverse transforms - Notch filters - Thin film transistors - Frequency domain analysis - Inverse problems - Liquid crystal displays - Bandpass filters - Defects - Fast Fourier transforms;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Large-sized flat-panel displays are widely used for PC monitors and TV displays. In this paper, frequency domain pre-filter algorithms are presented for detection of defects in large-sized Thin Film Transistor-Liquid Crystal Display(TFT-LCD) panel surfaces. Frequency analysis with 1-D, 2-D FFT methods for extract the periodic patterns of lattice structures in TFT-LCD is performed. To remove this patterns, frequency domain band-stop filters were used for eliminating specific frequency components. In order to acquire only defected images, 2-D inverse FFT methods to inverse transform of frequency domain images were used.
引用
收藏
页码：1295 / 1297
相关论文
共 50 条
  • [41] How Particle Detector Can Aid Visual Inspection for Defect Detection of TFT-LCD Manufacturing
    Khakifirooz, Marzieh
    Fathi, Mahdi
    UBICOMP/ISWC '20 ADJUNCT: PROCEEDINGS OF THE 2020 ACM INTERNATIONAL JOINT CONFERENCE ON PERVASIVE AND UBIQUITOUS COMPUTING AND PROCEEDINGS OF THE 2020 ACM INTERNATIONAL SYMPOSIUM ON WEARABLE COMPUTERS, 2020, : 547 - 552
  • [42] A new algorithm on the automatic TFT-LCD mura defects inspection based on an effective background reconstruction
    Ngo, Chinh
    Park, Yong Jin
    Jung, Jeehyun
    Ul Hassan, Rizwan
    Seok, Jongwon
    JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2017, 25 (12) : 737 - 752
  • [43] An Automatic Detection Algorithm for Surface Defects in TFT-LCD
    Ma, Ling
    Liu, Wei
    Liu, Yumin
    Jiang, Huiqin
    2013 SECOND IAPR ASIAN CONFERENCE ON PATTERN RECOGNITION (ACPR 2013), 2013, : 847 - 851
  • [44] Development of Electrical Models of TFT-LCD Panels for Circuit Simulation
    Park, Hyunwoo
    Kim, Soo Hwan
    Kim, Sung Ha
    Kim, Suki
    McCartney, Richard I.
    IMID/IDMC 2006: THE 6TH INTERNATIONAL MEETING ON INFORMATION DISPLAY/THE 5TH INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE, DIGEST OF TECHNICAL PAPERS, 2006, : 733 - 738
  • [45] AN AUTOMATIC INSPECTION METHOD FOR THE FRACTURE CONDITIONS OF ANISOTROPIC CONDUCTIVE FILM IN THE TFT-LCD ASSEMBLY PROCESS
    Lin, Chern-Sheng
    Huang, Kuo-Hon
    Lin, Tsung-Chih
    Shei, Hung-Jung
    Tien, Chuen-Lin
    INTERNATIONAL JOURNAL OF OPTOMECHATRONICS, 2011, 5 (03) : 286 - 298
  • [46] TFT-LCD Mura defects automatic inspection system using linear regression diagnostic model
    Chen, S-L
    Chang, J-H
    PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART B-JOURNAL OF ENGINEERING MANUFACTURE, 2008, 222 (11) : 1489 - 1501
  • [47] An automatic vision inspecting system for TFT-LCD defects
    Liu, BH
    Zhang, J
    Zhang, Y
    Wu, LY
    PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, VOL 2, 2004, : 1304 - 1308
  • [48] Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition
    Tsai, DM
    Hung, CY
    INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2005, 43 (21) : 4589 - 4607
  • [49] Non referential method for defects inspection of TFT-LCD pad
    Kim, Hye Won
    Yoo, Suk In
    IMAGE PROCESSING: MACHINE VISION APPLICATIONS, 2008, 6813
  • [50] A Novel Multicategory Defect Detection Method Based on the Convolutional Neural Network Method for TFT-LCD Panels
    Chang, Yung-Chia
    Chang, Kuei-Hu
    Meng, Hsien-Mi
    Chiu, Hung-Chih
    MATHEMATICAL PROBLEMS IN ENGINEERING, 2022, 2022
12345