Influence of tip wear on atomic force acoustic microscopy experiments

被引：0
|
作者：
Kopycinska-Müler, Mulgorzata [1 ]
Geiss, Roy H. [1 ]
Rice, Paul [1 ]
Hurley, Donna C. [1 ]
机构：
[1] Materials Reliability Division, National Institute of Standards and Technology, Boulder, CO 80303-3328, United States
来源：
Mater Res Soc Symp Proc | 1600年 / 146-151期
关键词：
Compendex;
D O I：
2004 MRS Fall Meeting
中图分类号：
学科分类号：
摘要：
Acoustic variables measurement - Atomic force microscopy - Elastic constants - Mathematical models - Scanning electron microscopy
引用
收藏
相关论文
共 50 条
  • [21] Probing the wear characteristics of graphene on flexible polymer substrates using a heated atomic force microscopy tip
    Chang, Shunyu
    Yan, Yongda
    Wang, Jiqiang
    Li, Chen
    Geng, Yanquan
    [J]. MATERIALS & DESIGN, 2023, 233
  • [22] A NOVEL ZNO WHISKER TIP FOR ATOMIC FORCE MICROSCOPY
    KADO, H
    YOKOYAMA, K
    TOHDA, T
    [J]. ULTRAMICROSCOPY, 1992, 42 : 1659 - 1663
  • [23] Contrast artifacts in tapping tip atomic force microscopy
    Department of Physics, Bldg. 307, Technical University of Denmark, DK-2800 Lyngby, Denmark
    [J]. Appl Phys A, SUPPL. 1 (S329-S332):
  • [24] Contrast artifacts in tapping tip atomic force microscopy
    A. Kühle
    A.H. Sorensen
    J.B. Zandbergen
    J. Bohr
    [J]. Applied Physics A, 1998, 66 : S329 - S332
  • [25] Contrast artifacts in tapping tip atomic force microscopy
    Kuhle, A
    Sorensen, AH
    Zandbergen, JB
    Bohr, J
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S329 - S332
  • [26] Characterizing Atomic Force Microscopy Tip Shape in Use
    Wang, Chunmei
    Itoh, Hiroshi
    Sun, Jielin
    Hu, Jun
    Shen, Dianhong
    Ichimura, Shingo
    [J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2009, 9 (02) : 803 - 808
  • [27] METHOD OF DETERMINING TIP STRUCTURE IN ATOMIC FORCE MICROSCOPY
    PAIK, SM
    KIM, S
    SCHULLER, IK
    [J]. PHYSICAL REVIEW B, 1991, 44 (07): : 3272 - 3276
  • [28] Atomic force acoustic microscopy: Influence of the lateral contact stiffness on the elastic measurements
    Flores-Ruiz, F. J.
    Espinoza-Beltran, F. J.
    Diliegros-Godines, C. J.
    Siqueiros, J. M.
    Herrera-Gomez, A.
    [J]. ULTRASONICS, 2016, 71 : 271 - 277
  • [29] Tip wear and tip breakage in high-speed atomic force microscopes
    Strahlendorff, Timo
    Dai, Gaoliang
    Bergmann, Detlef
    Tutsch, Rainer
    [J]. ULTRAMICROSCOPY, 2019, 201 : 28 - 37
  • [30] DIRECT OBSERVATION OF THE ATOMIC-FORCE MICROSCOPY TIP USING INVERSE ATOMIC-FORCE MICROSCOPY IMAGING
    MONTELIUS, L
    TEGENFELDT, JO
    VANHEEREN, P
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 2222 - 2226
12345