Contrast artifacts in tapping tip atomic force microscopy

被引：0
|
作者：
A. Kühle
A.H. Sorensen
J.B. Zandbergen
J. Bohr
机构：
[1] Department of Physics,
[2] bldg. 307,undefined
[3] The Technical University of Denmark,undefined
[4] DK-2800 Lyngby,undefined
[5] Denmark (Fax: (+45-45/93-27-66,undefined
[6] E-mail: anders.kyhle@fysik.dtu.dk),undefined
来源：
Applied Physics A | 1998年 / 66卷
关键词：
PACS: 61.16.Ch; 87.15; 87.64.Dz;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：S329 / S332
相关论文
共 50 条
  • [1] Contrast artifacts in tapping tip atomic force microscopy
    Department of Physics, Bldg. 307, Technical University of Denmark, DK-2800 Lyngby, Denmark
    Appl Phys A, SUPPL. 1 (S329-S332):
  • [2] Contrast artifacts in tapping tip atomic force microscopy
    Kuhle, A
    Sorensen, AH
    Zandbergen, JB
    Bohr, J
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S329 - S332
  • [3] TIP ARTIFACTS OF MICROFABRICATED FORCE SENSORS FOR ATOMIC FORCE MICROSCOPY
    GRUTTER, P
    ZIMMERMANNEDLING, W
    BRODBECK, D
    APPLIED PHYSICS LETTERS, 1992, 60 (22) : 2741 - 2743
  • [4] Study of tip-sample contact process and phase contrast in tapping mode atomic force microscopy
    Wang, XP
    Lei, L
    Hu, HL
    Kun, Z
    ACTA PHYSICA SINICA, 2004, 53 (04) : 1008 - 1014
  • [5] Studies of tip wear processes in tapping mode™ atomic force microscopy
    Su, CM
    Huang, L
    Kjoller, K
    Babcock, K
    ULTRAMICROSCOPY, 2003, 97 (1-4) : 135 - 144
  • [6] Mechanisms of formation of phase contrast in tapping mode atomic force microscopy
    Chizhik, SA
    Ahn, HS
    Suslov, AA
    Kovalev, AV
    Kim, CH
    PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2001, 3-4 : 39 - 46
  • [7] Artifacts in Atomic Force Microscopy
    Gainutdinov R.V.
    Arutyunov P.A.
    Russian Microelectronics, 2001, 30 (4) : 219 - 224
  • [8] Artifacts in atomic force microscopy
    Gajnutdinov, R.V.
    Arutyunov, P.A.
    Mikroelektronika, 2001, 30 (04): : 257 - 266
  • [9] Imaging stability and average tip-sample force in tapping mode atomic force microscopy
    Kowalewski, T
    Legleiter, J
    JOURNAL OF APPLIED PHYSICS, 2006, 99 (06)
  • [10] Imaging stability and average tip-sample force in tapping mode atomic force microscopy
    Kowalewski, Tomasz
    Legleiter, Justin
    Journal of Applied Physics, 2006, 99 (06):
12345