Non-uniformity correction technique for amorphous silicon flat-panel detector

被引：0
|
作者：
Liang, Li-Hong
Wang, Xiao
Lu, Hong-Nian
机构：
[1] China Special Equipment Inspection and Research Center, Beijing 100013, China
[2] Mechanical Engineering and Automation School, Beihang University, Beijing 100083, China
[3] Department of Electronic Engineering, North China Institute of Aerospace Engineering, Langfang 065000, China
来源：
Guangdian Gongcheng/Opto-Electronic Engineering | 2005年 / 32卷 / 08期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：36 / 39
相关论文
共 50 条
  • [1] Non-uniformity emendation technique for amorphous silicon flat-panel detectors used for industrial X-ray digital radiography
    Wang, Xiao
    Han, Yan
    Si, Jinjuan
    [J]. MEASUREMENT, 2008, 41 (07) : 817 - 822
  • [2] Synchrotron applications of an amorphous silicon flat-panel detector
    Lee, John H.
    Aydiner, C. Can
    Almer, Jonathan
    Bernier, Joel
    Chapman, Karena W.
    Chupas, Peter J.
    Haeffner, Dean
    Kump, Ken
    Lee, Peter L.
    Lienert, Ulrich
    Miceli, Antonino
    Vera, German
    [J]. JOURNAL OF SYNCHROTRON RADIATION, 2008, 15 : 477 - 488
  • [3] Imaging characteristics of an amorphous silicon flat-panel detector for digital chest radiography
    Floyd, CE
    Warp, RJ
    Dobbins, JT
    Chotas, HG
    Baydush, AH
    Vargas-Voracek, R
    Ravin, CE
    [J]. RADIOLOGY, 2001, 218 (03) : 683 - 688
  • [4] Characterization of a flat-panel amorphous silicon detector for X-ray computed tomography
    Lee, H.-R.
    Ellingson, W.
    [J]. Journal of X-Ray Science and Technology, 2001, 9 (01) : 43 - 53
  • [5] Radiation dose reduction in chest radiography using a flat-panel amorphous silicon detector
    Hosch, WP
    Fink, C
    Radeleff, B
    Kampschulte, A
    Kauffmann, GW
    Hansmann, J
    [J]. CLINICAL RADIOLOGY, 2002, 57 (10) : 902 - 907
  • [6] Fast imaging of a 41cm amorphous silicon flat-panel detector for radiographic applications
    Kump, KS
    [J]. MEDICAL IMAGING 2001: PHYSICS OF MEDICAL IMAGING, 2001, 4320 : 87 - 93
  • [7] Image quality vs radiation dose for a flat-panel amorphous silicon detector: a phantom study
    Geijer, H
    Beckman, KW
    Andersson, T
    Persliden, J
    [J]. EUROPEAN RADIOLOGY, 2001, 11 (09) : 1704 - 1709
  • [8] Image quality vs radiation dose for a flat-panel amorphous silicon detector: a phantom study
    Håkan Geijer
    Karl-Wilhelm Beckman
    Torbjörn Andersson
    Jan Persliden
    [J]. European Radiology, 2001, 11 : 1704 - 1709
  • [9] A gain correction method based on threshold for flat-panel detector
    Xiao, Da-Yu
    Cai, Peng-Fei
    Li, Hong
    Kang, Yan
    [J]. Dongbei Daxue Xuebao/Journal of Northeastern University, 2014, 35 (02): : 208 - 211
  • [10] Simulation of the response function of an amorphous silicon flat-panel array
    Cremers, F
    Kausch, C
    Albers, D
    Todorovic, M
    Schmidt, R
    [J]. ADVANCED MONTE CARLO FOR RADIATION PHYSICS, PARTICLE TRANSPORT SIMULATION AND APPLICATIONS, 2001, : 395 - 399
12345