Non-uniformity correction technique for amorphous silicon flat-panel detector

被引：0
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作者：
Liang, Li-Hong
Wang, Xiao
Lu, Hong-Nian
机构：
[1] China Special Equipment Inspection and Research Center, Beijing 100013, China
[2] Mechanical Engineering and Automation School, Beihang University, Beijing 100083, China
[3] Department of Electronic Engineering, North China Institute of Aerospace Engineering, Langfang 065000, China
来源：
Guangdian Gongcheng/Opto-Electronic Engineering | 2005年 / 32卷 / 08期
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页码：36 / 39
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