Fully vertical AlN-on-SiC Schottky barrier diodes

被引:0
|
作者
Okumura, Hironori [1 ]
Imura, Masataka [2 ]
Miyazawa, Fuga [1 ]
Mainini, Lorenzo [1 ,3 ]
机构
[1] Univ Tsukuba, Inst Pure & Appl Sci, Tsukuba, Ibaraki 3058573, Japan
[2] Natl Inst Mat Sci, Res Ctr Funct Mat, Tsukuba, Ibaraki 3050044, Japan
[3] Politecn Milan, Dept Chem Mat & Chem Engn, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy
关键词
vertical device; AlN; SBD; MOCVD; leakage current; hetero epitaxial layer; PARASITIC REACTION; ALUMINUM NITRIDE; GROWTH; TEMPLATES; EPITAXY; SI(111); LAYER; MOVPE;
D O I
10.35848/1347-4065/ad7dc3
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrated fully vertical Schottky barrier diodes (SBDs) that have a Si-doped AlN drift layer directly grown on an n-type 4H-SiC substrate by metal-organic CVD. The AlN SBD with a Ni anode showed a clear rectifying characteristic at 300-500 K and a rectification ratio of about 10-2. We found that the leakage current of the vertical AlN-on-SiC devices is affected by defects in the AlN drift layer and Schottky interface.
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页数:5
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