共 50 条
- [42] Modeling of Trap Generation in 3-D NAND Charge Trap Flash Memory 2024 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, SISPAD 2024, 2024,
- [45] Towards Improving Ionizing Radiation Tolerance of 3-D NAND Flash Memory 2023 IEEE INTERNATIONAL MEMORY WORKSHOP, IMW, 2023, : 109 - 112
- [46] Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 2017 IEEE 9TH INTERNATIONAL MEMORY WORKSHOP (IMW), 2017, : 44 - 47
- [49] Cross-temperature Reliabilities in TLC 3D NAND Flash Memory: Characterization and Solution 2023 7TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM, 2023,