SiM-YOLO: A Wood Surface Defect Detection Method Based on the Improved YOLOv8

Wood surface defect detection is a challenging task due to the complexity and variability of defect types. To address these challenges, this paper introduces a novel deep learning approach named SiM-YOLO, which is built upon the YOLOv8 object detection framework. A fine-grained convolutional structure, SPD-Conv, is introduced with the aim of preserving detailed defect information during the feature extraction process, thus enabling the model to capture the subtle variations and complex details of wood surface defects. In the feature fusion stage, a SiAFF-PANet-based wood defect feature fusion module is designed to improve the model's ability to focus on local contextual information and enhance defect localization. For classification and regression tasks, the multi-attention detection head (MADH) is employed to capture cross-channel information and the accurate spatial localization of defects. In addition, MPDIoU is employed to optimize the loss function of the model to reduce the leakage of detection due to defect overlap. The experimental results show that SiM-YOLO achieves superior performance compared to the state-of-the-art YOLO algorithm, with a 9.3% improvement in mAP over YOLOX and a 4.3% improvement in mAP over YOLOv8. The Grad-CAM visualization further illustrates that SiM-YOLO provides more accurate defect localization and effectively reduces misdetection and omission issues. This study highlights the effectiveness of SiM-YOLO for wood surface defect detection and offers valuable insights for future research and practical applications in quality control.