An Efficient and Accurate Surface Defect Detection Method for Wood Based on Improved YOLOv8

被引:0
|
作者
Wang, Rijun [1 ,2 ]
Liang, Fulong [1 ,2 ]
Wang, Bo [2 ,3 ]
Zhang, Guanghao [1 ,2 ]
Chen, Yesheng [1 ,2 ]
Mou, Xiangwei [1 ,2 ]
机构
[1] Guangxi Normal Univ, Sch Teachers Coll Vocat & Tech Educ, Guilin 541004, Peoples R China
[2] Hechi Univ, Key Lab AI & Informat Proc, Yizhou 546300, Peoples R China
[3] Hechi Univ, Sch Artificial Intelligence & Smart Mfg, Yizhou 546300, Peoples R China
来源
FORESTS | 2024年 / 15卷 / 07期
关键词
deep learning; wood defects; small target detection; YOLOv8; attention mechanism; CLASSIFICATION;
D O I
10.3390/f15071176
中图分类号
S7 [林业];
学科分类号
0829 ; 0907 ;
摘要
Accurate detection of wood surface defects plays a pivotal role in enhancing wood grade sorting precision, maintaining high standards in wood processing quality, and safeguarding forest resources. This paper introduces an efficient and precise approach to detecting wood surface defects, building upon enhancements to the YOLOv8 model, which demonstrates significant performance enhancements in handling multi-scale and small-target defects commonly found in wood. The proposed method incorporates the dilation-wise residual (DWR) module in the trunk and the deformable large kernel attention (DLKA) module in the neck of the YOLOv8 architecture to enhance the network's capability in extracting and fusing multi-scale defective features. To further improve the detection accuracy of small-target defects, the model replaces all the detector heads of YOLOv8 with dynamic heads and adds an additional small-target dynamic detector head in the shallower layers. Additionally, to facilitate faster and more-efficient regression, the original complete intersection over union (CIoU) loss function of YOLOv8 is replaced with the IoU with minimum points distance (MPDIoU) loss function. Experimental results indicate that compared with the YOLOv8n baseline model, the proposed method improves the mean average precision (mAP) by 5.5%, with enhanced detection accuracy across all seven defect types tested. These findings suggest that the proposed model exhibits a superior ability to detect wood surface defects accurately.
引用
收藏
页数:19
相关论文
共 50 条
  • [1] SiM-YOLO: A Wood Surface Defect Detection Method Based on the Improved YOLOv8
    Xi, Honglei
    Wang, Rijun
    Liang, Fulong
    Chen, Yesheng
    Zhang, Guanghao
    Wang, Bo
    [J]. COATINGS, 2024, 14 (08)
  • [2] Improved Steel Surface Defect Detection Algorithm Based on YOLOv8
    You, Congzhe
    Kong, Haozheng
    [J]. IEEE ACCESS, 2024, 12 : 99570 - 99577
  • [3] An Insulator Location and Defect Detection Method Based on Improved YOLOv8
    Li, Zhongsheng
    Jiang, Chenda
    Li, Zhongliang
    [J]. IEEE ACCESS, 2024, 12 : 106781 - 106792
  • [4] A defect detection method for industrial aluminum sheet surface based on improved YOLOv8 algorithm
    Wang, Luyang
    Zhang, Gongxue
    Wang, Weijun
    Chen, Jinyuan
    Jiang, Xuyao
    Yuan, Hai
    Huang, Zucheng
    [J]. FRONTIERS IN PHYSICS, 2024, 12
  • [5] An Improved YOLOv8 Algorithm for Rail Surface Defect Detection
    Wang, Yan
    Zhang, Kehua
    Wang, Ling
    Wu, Lintong
    [J]. IEEE ACCESS, 2024, 12 : 44984 - 44997
  • [6] Automotive adhesive defect detection based on improved YOLOv8
    Chunjie Wang
    Qibo Sun
    Xiaogang Dong
    Jia Chen
    [J]. Signal, Image and Video Processing, 2024, 18 : 2583 - 2595
  • [7] Fabric defect detection algorithm based on improved YOLOv8
    Chen, Chang
    Zhou, Qihong
    Li, Shujia
    Luo, Dong
    Tan, Gaochao
    [J]. TEXTILE RESEARCH JOURNAL, 2024,
  • [8] Automotive adhesive defect detection based on improved YOLOv8
    Wang, Chunjie
    Sun, Qibo
    Dong, Xiaogang
    Chen, Jia
    [J]. SIGNAL IMAGE AND VIDEO PROCESSING, 2024, 18 (03) : 2583 - 2595
  • [9] Defect Detection of Photovoltaic Cells Based on Improved YOLOv8
    Zhou Ying
    Yan Yuze
    Chen Haiyong
    Pei Shenghu
    [J]. LASER & OPTOELECTRONICS PROGRESS, 2024, 61 (08)
  • [10] Steel Surface Defect Detection Algorithm Based on YOLOv8
    Song, Xuan
    Cao, Shuzhen
    Zhang, Jingwei
    Hou, Zhenguo
    [J]. ELECTRONICS, 2024, 13 (05)