Black-sun noise immune correlated double sampling scheme for CMOS image sensors

被引：0
|
作者：
Lee, Je-Hoon [1 ]
Kim, Hyeon-June [1 ]
机构：
[1] Kangwon Natl Univ, Dept Elect Informat Commun Engn, 1 Joongang Ro, Samcheok 245711, Gangwon, South Korea
来源：
IEICE ELECTRONICS EXPRESS | 2021年 / 18卷 / 10期
基金：
新加坡国家研究基金会;
关键词：
CMOS imager sensor; black-sun noise; correlated double sampling; single-slope analog digital converter; PHOTODIODE; ADC;
D O I：
10.1587/elex.18.20210175
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a black-sun immune correlated double sampling (CDS) scheme for high-quality imaging. Based on an analysis of signal characteristics in strong light conditions, a clamping circuit-based signal difference generator is proposed to accurately present the bright light information. The proposed scheme eliminates the black-sun noise with simple circuitry to improve the A/D conversion efficiency. Moreover, it can be is reversible to the conventional algorithm so that it still preserves the structural advantages of the existing CMOS image sensor (CIS) structure. A prototype CIS with a column-parallel 11-bit single-slope (SS) analog-to-digital converter (ADC) was fabricated in a 0.11-mu m 1P4M CIS process with a 2.9-mu m pixel pitch.
引用
收藏
页数：3
相关论文
共 50 条
  • [1] A Sun-Tracking CMOS Image Sensor With Black-Sun Readout Scheme
    Kim, Hyeon-June
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (03) : 1115 - 1120
  • [2] Area-efficient correlated double sampling scheme with single sampling capacitor for CMOS image sensors
    Han, SW
    Yoon, E
    [J]. ELECTRONICS LETTERS, 2006, 42 (06) : 335 - 337
  • [3] Global shutter pixels with correlated double sampling for CMOS image sensors
    Meynants, Guy
    [J]. ADVANCED OPTICAL TECHNOLOGIES, 2013, 2 (02) : 177 - 187
  • [4] THE IMPACT OF DEVICE MISMATCH ON THE PERFORMANCE OF CORRELATED DOUBLE SAMPLING CIRCUITS IN CMOS IMAGE SENSORS
    Liu, Weihui
    Jin, Xiangliang
    Yang, Hongjia
    Tang, Lizhen
    Yang, Jia
    [J]. ELECTRONICS WORLD, 2017, 123 (1969): : 30 - 34
  • [5] Column-Parallel Correlated Multiple Sampling Circuits for CMOS Image Sensors and Their Noise Reduction Effects
    Suh, Sungho
    Itoh, Shinya
    Aoyama, Satoshi
    Kawahito, Shoji
    [J]. SENSORS, 2010, 10 (10) : 9139 - 9154
  • [6] Column-Parallel Digital Correlated Multiple Sampling for Low-Noise CMOS Image Sensors
    Chen, Yue
    Xu, Yang
    Mierop, Adri J.
    Theuwissen, Albert J. P.
    [J]. IEEE SENSORS JOURNAL, 2012, 12 (04) : 793 - 799
  • [7] A low noise and low power CMOS image sensor with pixel-level correlated double sampling
    Kim, Dongsoo
    Han, Gunhee
    [J]. PROCEEDINGS OF THE 2007 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, 2007, : 113 - +
  • [8] A Double-Data-Rate Ripple Counter With Calibration Circuits for Correlated Multiple Sampling in CMOS Image Sensors
    Zha, Wanbin
    Xu, Jiangtao
    Nie, Kaiming
    Gao, Zhiyuan
    [J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024,
  • [9] Correlated Multiple Sampling Technique for Low-Light CMOS Image Sensors
    Li, Shaomeng
    Nie, Kaiming
    Xu, Jiangtao
    [J]. LASER & OPTOELECTRONICS PROGRESS, 2023, 60 (12)
  • [10] CMOS Image Sensor Random Telegraph Noise Time Constant Extraction From Correlated To Uncorrelated Double Sampling
    Chao, Calvin Yi-Ping
    Tu, Honyih
    Wu, Thomas
    Chou, Kuo-Yu
    Yeh, Shang-Fu
    Hsueh, Fu-Lung
    [J]. IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2017, 5 (01): : 79 - 89
12345