Black-sun noise immune correlated double sampling scheme for CMOS image sensors

被引：0
|
作者：
Lee, Je-Hoon [1 ]
Kim, Hyeon-June [1 ]
机构：
[1] Kangwon Natl Univ, Dept Elect Informat Commun Engn, 1 Joongang Ro, Samcheok 245711, Gangwon, South Korea
来源：
IEICE ELECTRONICS EXPRESS | 2021年 / 18卷 / 10期
基金：
新加坡国家研究基金会;
关键词：
CMOS imager sensor; black-sun noise; correlated double sampling; single-slope analog digital converter; PHOTODIODE; ADC;
D O I：
10.1587/elex.18.20210175
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a black-sun immune correlated double sampling (CDS) scheme for high-quality imaging. Based on an analysis of signal characteristics in strong light conditions, a clamping circuit-based signal difference generator is proposed to accurately present the bright light information. The proposed scheme eliminates the black-sun noise with simple circuitry to improve the A/D conversion efficiency. Moreover, it can be is reversible to the conventional algorithm so that it still preserves the structural advantages of the existing CMOS image sensor (CIS) structure. A prototype CIS with a column-parallel 11-bit single-slope (SS) analog-to-digital converter (ADC) was fabricated in a 0.11-mu m 1P4M CIS process with a 2.9-mu m pixel pitch.
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页数：3
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