A single-slope based low-noise ADC with input-signal-dependent multiple sampling scheme for CMOS image sensors

被引：0

作者：

Shinozuka, Yasuhiro ^{[1
]}

Shiraishi, Kei ^{[1
]}

Furuta, Masanori ^{[1
]}

Itakura, Tetsuro ^{[1
]}

机构：

[1] Toshiba Co Ltd, Saiwai Ku, 1 Komukai,Toshiba Cho, Kawasaki, Kanagawa 2128582, Japan

来源：

2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2015年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a multiple-sampling technique using a Single-Slope ADC (SSADC) for low-noise CMOS image sensors. In the proposed technique, the number of sampling is controlled depending on an input signal to effectively reduce the noise of a readout circuit at dark-light illumination. An example of circuit implementation is illustrated. The simulation results show the increase of number of sampling and the reduction of the readout circuit noise at a small input signal. The improvement of SNR is 22.8dB.

引用

页码：357 / 360

页数：4

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