A single-slope based low-noise ADC with input-signal-dependent multiple sampling scheme for CMOS image sensors

被引：0

作者：

Shinozuka, Yasuhiro ^{[1
]}

Shiraishi, Kei ^{[1
]}

Furuta, Masanori ^{[1
]}

Itakura, Tetsuro ^{[1
]}

机构：

[1] Toshiba Co Ltd, Saiwai Ku, 1 Komukai,Toshiba Cho, Kawasaki, Kanagawa 2128582, Japan

来源：

2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2015年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a multiple-sampling technique using a Single-Slope ADC (SSADC) for low-noise CMOS image sensors. In the proposed technique, the number of sampling is controlled depending on an input signal to effectively reduce the noise of a readout circuit at dark-light illumination. An example of circuit implementation is illustrated. The simulation results show the increase of number of sampling and the reduction of the readout circuit noise at a small input signal. The improvement of SNR is 22.8dB.

引用

页码：357 / 360

页数：4

共 50 条

[21] Signal processing architectures for low-noise high-resolution CMOS image sensors
Kawahito, S.
[J]. PROCEEDINGS OF THE IEEE 2007 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2007, : 695 - 702
[22] Low-Power CMOS Image Sensor Based on Column-Parallel Single-Slope/SAR Quantization Scheme
Tang, Fang
Chen, Denis Guangyin
Wang, Bo
Bermak, Amine
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2013, 60 (08) : 2561 - 2566
[23] Low-Noise In-Pixel Comparing Active Pixel Senscor Using Column-Level Single-Slope ADC
Lee, Dongmyung
Cho, Kunhee
Kim, Dongsoo
Han, Gunhee
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (12) : 3383 - 3388
[24] Zero-crossing-prediction-based Single-slope ADC with a Constant Charge Bias Amplifier for Low Power Image Sensors
Park, Keunyeol
Lee, Hohyeon
Kim, Soo Youn
[J]. 2022 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS 22), 2022, : 2787 - 2791
[25] A fast correlated multiple sampling technique based on 12-bit SAR ADC with digital calibration for low-noise CMOS image sensor
Nie, Kaiming
Yin, Zhaoyang
Xu, Jiangtao
[J]. MICROELECTRONICS JOURNAL, 2017, 59 : 47 - 54
[26] Noise Reduction Effect of Multiple-Sampling-Based Signal-Readout Circuits for Ultra-Low Noise CMOS Image Sensors
Kawahito, Shoji
Seo, Min-Woong
[J]. SENSORS, 2016, 16 (11):
[27] Design of a CMOS Image Sensor Based on a 10-bit Two-Step Single-Slope ADC
Hwang, Yeonseong
Song, Minkyu
[J]. JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2014, 14 (02) : 246 - 251
[28] An Area-Efficient and Low-Power 12-b SAR/Single-Slope ADC Without Calibration Method for CMOS Image Sensors
Kim, Min-Kyu
Hong, Seong-Kwan
Kwon, Oh-Kyong
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (09) : 3599 - 3604
[29] A Low Noise CMOS Image Sensor with a 14-bit Two-Step Single-Slope ADC and a Column Self-Calibration Technique
Lim, Woongtaek
Hwang, Jongyoon
Kim, Dongjoo
Jeon, Shiwon
Son, Suho
Song, Minkyu
[J]. 2014 21ST IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS (ICECS), 2014, : 48 - 51
[30] Low-noise Image Sensors with Shifted Pseudo-correlated Multiple Sampling Method
Yun, Su Yeon
Song, Mm Kyu
Kim, Soo Youn
[J]. 2024 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, ISCAS 2024, 2024,

← 1 2 3 4 5 →