A single-slope based low-noise ADC with input-signal-dependent multiple sampling scheme for CMOS image sensors

被引：0
|
作者：
Shinozuka, Yasuhiro [1 ]
Shiraishi, Kei [1 ]
Furuta, Masanori [1 ]
Itakura, Tetsuro [1 ]
机构：
[1] Toshiba Co Ltd, Saiwai Ku, 1 Komukai,Toshiba Cho, Kawasaki, Kanagawa 2128582, Japan
来源：
2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2015年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a multiple-sampling technique using a Single-Slope ADC (SSADC) for low-noise CMOS image sensors. In the proposed technique, the number of sampling is controlled depending on an input signal to effectively reduce the noise of a readout circuit at dark-light illumination. An example of circuit implementation is illustrated. The simulation results show the increase of number of sampling and the reduction of the readout circuit noise at a small input signal. The improvement of SNR is 22.8dB.
引用
收藏
页码：357 / 360
页数：4
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