Global shutter pixels with correlated double sampling for CMOS image sensors

被引：8
|
作者：
Meynants, Guy [1 ]
机构：
[1] CMOSIS NV, Coveliersstr 15, B-2600 Antwerp, Belgium
来源：
ADVANCED OPTICAL TECHNOLOGIES | 2013年 / 2卷 / 02期
关键词：
CMOS image sensor; global shutter; pixel;
D O I：
10.1515/aot-2012-0084
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This article describes the operation and performance of global shutter pixels with correlated double sampling for CMOS image sensors. Correlated double sampling is required to keep the read noise at a level comparable to interline transfer CCDs. A pixel with voltage domain in-pixel sampling of the floating diffusion reset and signal levels is explained and its noise performance is modeled. The saturation level of this pixel is analyzed and parasitic light sensitivity is discussed. The pixel is benchmarked against other global shutter pixels that allow correlated double sampling, based upon charge domain in-pixel storage.
引用
收藏
页码：177 / 187
页数：11
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