A LOW-COST TESTER FOR BOUNDARY SCAN

被引：1
|
作者：
VANDEGOOR, AJ [1 ]
VANTETERING, JAM [1 ]
机构：
[1] BELL TEL MFG CO,ANTWERP,BELGIUM
来源：
MICROPROCESSORS AND MICROSYSTEMS | 1991年 / 15卷 / 02期
关键词：
TESTING; BUILT-IN SELF TEST; BOUNDARY SCAN; TEST ACCESS PORT; TEST CONTROLLER;
D O I：
10.1016/0141-9331(91)90088-W
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper describes the architecture and implementation of a controller for the test access port (TAP) of the standard test access port and boundary-scan architectures as defined in IEEE Std. 1149.1-1990. This controller allows any PC to be used for testing chips, boards and/or systems provided with boundary scan test facilities.
引用
收藏
页码：82 / 90
页数：9
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