ARE LOW-COST TESTERS REALLY LOW-COST

被引：0

作者：

RADKE, C ^{[1
]}

机构：

[1] IBM CORP, ARMONK, NY 10504 USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1984年 / 1卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：101 / 101

页数：1

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