LOW-COST TESTERS - ARE THEY REALLY LOW-COST

被引：2
|
作者：
BOWERS, GH
PRATT, BG
机构：
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1985年 / 2卷 / 03期
关键词：
D O I：
10.1109/MDT.1985.294734
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：20 / 28
页数：9
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