DEVICE PROCESS DEPENDENCE OF LOW-FREQUENCY NOISE IN GAALAS/GAAS HETEROSTRUCTURE

被引：17
|
作者：
TACANO, M
SUGIYAMA, Y
SOGA, H
机构：
来源：
SOLID-STATE ELECTRONICS | 1989年 / 32卷 / 01期
关键词：
D O I：
10.1016/0038-1101(89)90047-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：49 / 55
页数：7
相关论文
共 50 条
  • [31] OUTPUT IMPEDANCE FREQUENCY DISPERSION AND LOW-FREQUENCY NOISE IN GAAS-MESFETS
    GITLIN, D
    VISWANATHAN, CR
    ABIDI, AA
    JOURNAL DE PHYSIQUE, 1988, 49 (C-4): : 201 - 204
  • [32] CURRENT DEPENDENCE OF LOW-FREQUENCY NOISE IN BIPOLAR-TRANSISTORS
    DAS, MB
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, 22 (12) : 1092 - 1098
  • [33] Geometrical dependence of the low-frequency noise in superconducting flux qubits
    Lanting, T.
    Berkley, A. J.
    Bumble, B.
    Bunyk, P.
    Fung, A.
    Johansson, J.
    Kaul, A.
    Kleinsasser, A.
    Ladizinsky, E.
    Maibaum, F.
    Harris, R.
    Johnson, M. W.
    Tolkacheva, E.
    Amin, M. H. S.
    PHYSICAL REVIEW B, 2009, 79 (06):
  • [34] LOW-FREQUENCY NOISE AND DLTS SEMICONDUCTOR-DEVICE CHARACTERIZATION
    SCHOLZ, F
    HWANG, JM
    SCHRODER, DK
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (11) : 2544 - 2544
  • [35] Impact of trap localization on low-frequency noise in nanoscale device
    Lee, Jae Woo
    Yun, Wan Soo
    Ghibaudo, Gerard
    JOURNAL OF APPLIED PHYSICS, 2014, 115 (19)
  • [36] DC CONDUCTION AND LOW-FREQUENCY NOISE CHARACTERISTICS OF GAALAS/GAAS SINGLE HETEROJUNCTION BIPOLAR-TRANSISTORS AT ROOM-TEMPERATURE AND LOW-TEMPERATURES
    RAMAN, VK
    VISWANATHAN, CR
    KIM, ME
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (06) : 1054 - 1058
  • [37] Correlation-impulse device for measuring electronic device low-frequency noise
    Borodin, AM
    Malyshev, VM
    APEDE 2004: INTERNATIONAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRON DEVICES ENGINEERING, CONFERENCE PROCEEDINGS, 2004, : 50 - 55
  • [38] The Systematic Error of Measurement of the Exponent of the Frequency Dependence of the Spectrum of Low-Frequency Noise
    V. A. Sergeev
    S. E. Rezchikov
    Measurement Techniques, 2016, 58 : 1160 - 1166
  • [39] THE SYSTEMATIC ERROR OF MEASUREMENT OF THE EXPONENT OF THE FREQUENCY DEPENDENCE OF THE SPECTRUM OF LOW-FREQUENCY NOISE
    Sergeev, V. A.
    Rezchikov, S. E.
    MEASUREMENT TECHNIQUES, 2016, 58 (10) : 1160 - 1166
  • [40] LOW-FREQUENCY NOISE IN IDEAL GAAS SCHOTTKY-BARRIER DIODES
    SISSON, MJ
    HANSOM, AM
    GRANT, AJ
    WHITE, AM
    DAY, B
    ELECTRONICS LETTERS, 1978, 14 (20) : 662 - 663
12345