The Systematic Error of Measurement of the Exponent of the Frequency Dependence of the Spectrum of Low-Frequency Noise

被引：0
|
作者：
V. A. Sergeev
S. E. Rezchikov
机构：
[1] Russian Academy of Sciences,Ulyanovsk Branch, Kotelnikov Institute of Radio Engineering and Electronics
[2] Ulyanovsk State Technical University,undefined
来源：
Measurement Techniques | 2016年 / 58卷
关键词：
low-frequency; flicker-shot and thermal noise; noise spectral power density; exponent of the frequency dependence;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The features of measurements of the parameters of low-frequency noise with a spectrum of the form 1/fγ of electronic components are considered. Expressions for the systematic error in determining the exponent γ from the results of single measurements of the spectral power density of the noise by a direct estimate at two frequencies, taking thermal and shot noise of the monitored article into account, are obtained and analyzed. Recommendations on minimizing the total error in determining γ are given.
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页码：1160 / 1166
页数：6
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