METHOD OF DETERMINING TIP STRUCTURE IN ATOMIC FORCE MICROSCOPY

被引:17
|
作者
PAIK, SM
KIM, S
SCHULLER, IK
机构
[1] Physics Department, B-0319 University of California, San Diego, San Diego
来源
PHYSICAL REVIEW B | 1991年 / 44卷 / 07期
关键词
D O I
10.1103/PhysRevB.44.3272
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The stability of single atomic tip is tested using molecular-dynamics simulation. Many metallic single-atomic tips are unstable during the scan at a tip load well below typical experimental values. For the bcc W(111) tip, second-layer-tip-atomic contributions are comparable to the first-layer contribution. These results suggest that experimentally multiple-atom tips are involved in the scanning process. We propose a method to identify tip size and structure during the scanning process. The resultant images for a number of commonly used tip materials are interpreted and compared to experiments.
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页码:3272 / 3276
页数:5
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