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- [25] Low-frequency noise measurements of electrical stress in InAlN/GaN and AlGaN/GaN heterostructure field-effect transistors GALLIUM NITRIDE MATERIALS AND DEVICES VI, 2011, 7939
- [29] NOISE MEASUREMENTS ON JUNCTION FIELD-EFFECT TRANSISTORS REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (01): : 212 - 220