共 50 条
- [41] ELECTRONIC CONDUCTION MECHANISMS OF CS-IMPLANTED SIO2-FILMS AND B-IMPLANTED SIO2-FILMS [J]. APPLIED PHYSICS, 1977, 12 (02): : 137 - 148
- [44] MECHANISM OF ELECTRICAL BREAKDOWN IN SIO2-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) : 998 - 1007
- [45] DEFECT STRUCTURE OF VITREOUS SIO2-FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (03) : C127 - C127
- [48] NOZZLE BEAM DEPOSITION OF SIO2-FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01): : 453 - 456
- [49] THERMAL SIO2-FILMS - A STUDY BY HRTEM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (06) : C196 - C196
- [50] ON THE BREAKDOWN STATISTICS OF THIN SIO2-FILMS [J]. PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON CONDUCTION AND BREAKDOWN IN SOLID DIELECTRICS, 1989, : 364 - 368