STEP COVERAGE OF RF-DIODE-SPUTTERED SIO2-FILMS

被引:3
|
作者
SERIKAWA, T
机构
来源
关键词
Compendex;
D O I
10.1116/1.570519
中图分类号
O59 [应用物理学];
学科分类号
摘要
SILICA
引用
收藏
页码:582 / 586
页数:5
相关论文
共 50 条
  • [41] ELECTRONIC CONDUCTION MECHANISMS OF CS-IMPLANTED SIO2-FILMS AND B-IMPLANTED SIO2-FILMS
    GARTNER, W
    SCHULZ, M
    [J]. APPLIED PHYSICS, 1977, 12 (02): : 137 - 148
  • [42] THERMOLUMINESCENCE AND COLOR CENTERS IN RF-SPUTTERED SIO2 FILMS
    HICKMOTT, TW
    [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (05) : 2339 - +
  • [43] PRODUCTION AND ANNEALING OF COLOR CENTERS IN RF SPUTTERED SIO2 FILMS
    HICKMOTT, TW
    [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (06) : 2543 - &
  • [44] MECHANISM OF ELECTRICAL BREAKDOWN IN SIO2-FILMS
    RIDLEY, BK
    [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) : 998 - 1007
  • [45] DEFECT STRUCTURE OF VITREOUS SIO2-FILMS
    REVESZ, AG
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (03) : C127 - C127
  • [46] TITANIUM-CONTAINING SIO2-FILMS
    ZHAGATA, LA
    FELTYN, IA
    [J]. INORGANIC MATERIALS, 1978, 14 (06) : 868 - 870
  • [47] LOW-TEMPERATURE SIO2-FILMS
    FALCONY, C
    ORTIZ, A
    LOPEZ, S
    ALONSO, JC
    MUHL, S
    [J]. THIN SOLID FILMS, 1990, 193 (1-2) : 638 - 647
  • [48] NOZZLE BEAM DEPOSITION OF SIO2-FILMS
    WONG, J
    LU, TM
    MEHTA, S
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01): : 453 - 456
  • [49] THERMAL SIO2-FILMS - A STUDY BY HRTEM
    SRIVASTAVA, JK
    WAGNER, JB
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (06) : C196 - C196
  • [50] ON THE BREAKDOWN STATISTICS OF THIN SIO2-FILMS
    SUNE, J
    PLACENCIA, I
    FARRES, E
    BARNIOL, N
    AYMERICH, X
    [J]. PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON CONDUCTION AND BREAKDOWN IN SOLID DIELECTRICS, 1989, : 364 - 368