MECHANISM OF ELECTRICAL BREAKDOWN IN SIO2-FILMS

被引：81
|
作者：
RIDLEY, BK [1 ]
机构：
[1] UNIV ESSEX, DEPT PHYS, COLCHESTER, ENGLAND
来源：
JOURNAL OF APPLIED PHYSICS | 1975年 / 46卷 / 03期
关键词：
D O I：
10.1063/1.321721
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：998 / 1007
页数：10
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